► Exclusive 15MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System ► 10MP
► Exclusive 15MP / 25MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System
Electronics Forum | Mon Sep 23 13:08:47 EDT 2002 | dragonslayr
Daan has made a valid point with regards to expertise and use of a machine. Yet I recognize that with advanced technology, trades must occur. A hghly sophisticated AOI unit can and will help reduce overall cost of production. Therefore, a need to ha
Electronics Forum | Thu Apr 19 18:03:56 EDT 2018 | spikesnpearls
hello i am a new aoi programmer and i was wondering how to choose/change what type of lighting it uses while scanning the board.i use a yestech ytv-fx
Used SMT Equipment | AOI / Automated Optical Inspection
Capture on the fly technology 3D Fusion Lighting (RGB+White LED's) 5 megapixel color imaging 2 top-down and 4 side angle cameras Quick set-up High speed, high defect coverage Low false failure rate Programmable conveyor for boards up to 20 x 2
Used SMT Equipment | AOI / Automated Optical Inspection
Description: 2014 Vintage Fully functional Linux operating system Includes rework computer and offline programming station Options on the machine: - Off-line programming capability - Dotplate and lighting calibration tool - Programmable Z-Axi
Industry News | 2020-10-27 12:39:39.0
MIRTEC received a 2020 Mexico Technology Award in the category of Inspection – AOI Systems for its MV-6Z OMNI 3D In-Line AOI system. The award was announced during a Virtual Awards Ceremony on Monday, October 26, 2020.
Industry News | 2021-04-08 04:38:27.0
MIRTEC received a 2021 CIRCUITS ASSEMBLY NPI Award in the category of Test and Inspection – AOI for its MV-6Z OMNI 3D In-Line AOI system. The award was announced during a special online awards ceremony on Tuesday, April 6, 2021.
Parts & Supplies | SPI / Solder Paste Inspection
Quick programming, friendly programming interface Multiple measurement methods True one-button measurement Eight-way motion button, one-click focus Adjustable scanning pitch Solder paste 3D simulation function Powerful SPC function MARK
Technical Library | 2020-10-30 10:27:39.0
Preview of the Complete Aneryn's Orbotech Trion 2340 Manual. It explains how to programme the AOI machine, how to train new components (shapes), how to connect it to your network, among other processes. Following the Guide, you will minimize false alarms and escapes rates easily. Full Manual available at https://aneryn.com/creation/trion-2340-manual/ Digital development by Sinfonía Digital
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
► Exclusive 15MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System ► 10MP
► Exclusive 15MP / 25MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System
Career Center | Appleton, Wisconsin USA | Production,Quality Control
AOI Technician Requirements: AS or BS degree in Electronics, Automated Manufacturing or Engineering Some industrial experience is desired Computer, Electronics and automation knowledge is required Programming experience, similar to CNC programmi
Career Center | Phoenix, Arizona USA | Quality Control
Job Summary: Responsible for programming and operating automated optical inspection (AOI) machine for assembled printed circuit boards. Make IPC acceptability decisions during AOI operation. Must be computer literate. Inspects finished or in-pro
Career Center | Sullivan, Ohio USA | Engineering,Maintenance,Production,Quality Control,Technical Support
· Develop or upgrade preventative maintenance procedures for components, equipment, parts, or systems. · Quoting of jobs to be competitive with other companies. · Problem solving and communication with operators for quality assurance. Pro
Career Center | chennai, Tamil nadu India | Engineering,Production
KEY SKILLS; 1.PRINTING, PICK AND PLACE MACHINE OPERATION, 2.REFLOW OVEN CHARACTERISTICS, 3.IPC STANDARD,QUALITY POLICIES 4.AOI PROGRAMMING 5.c,c++LANGUAGES. 6.VerilogHDL. 7.ORCAD,PSPICE software known.
